Atomic Force Microscopy: Understanding Basic Modes and - download pdf or read online

By Greg Haugstad

ISBN-10: 0470638826

ISBN-13: 9780470638828

ISBN-10: 1118360664

ISBN-13: 9781118360668

This book enlightens readers on the simple floor houses and distance-dependent intersurface forces one needs to comprehend to procure even uncomplicated facts from an atomic strength microscope (AFM). the fabric turns into more and more complicated through the ebook, explaining info of calibration, actual beginning of artifacts, and signal/noise obstacles. assurance spans imaging, fabrics estate characterization, in-liquid interfacial research, tribology, and electromagnetic interactions.

“Supplementary fabric for this publication are available by means of getting into ISBN 9780470638828 on”

Chapter 1 assessment of AFM (pages 1–32):
Chapter 2 Distance?Dependent Interactions (pages 33–90):
Chapter three Z?Dependent strength Measurements with AFM (pages 91–136):
Chapter four Topographic Imaging (pages 137–186):
Chapter five Probing fabric homes I: section Imaging (pages 187–257):
Chapter 6 Probing fabric homes II: Adhesive Nanomechanics and Mapping Distance?Dependent Interactions (pages 258–329):
Chapter 7 Probing fabric houses III: Lateral strength equipment (pages 330–378):
Chapter eight info Post?Processing and Statistical research (pages 379–399):
Chapter nine complicated Dynamic strength equipment (pages 400–436):

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Additional info for Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications

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Applied scanning probe methods XII: Characterization. Nanoscience and Technology, 2009, Berlin/Heidelberg: Springer. [9] Gnecco, E. and E. Meyer, eds. Fundamentals of friction and wear on the nanoscale. Nanoscience and Technology, ed. P. Avouris, et al. 2007, Berlin: Springer-Verlag, p. 714. E. Read, and G. Williams, Anelastic and Dielectric Effects in Polymeric Solids. 1967, London: Wiley. , Structural and electrostatic complexity at a pentacene/insulator interface. Adv. Funct. , 2006, 16: 879–884.

Here. we give three examples involving rate-dependent sliding friction, temperature-dependent stiffness and adhesion, and humidity-dependent phase imaging. 18 contains a graph of friction force versus tip scanning velocity, in micrometers per second ranging nearly six decades of rate—varied via a combination of scan size and scan frequency (lines per second)—on a gelatin film. A peak around 1 mm/s represents a dominant activated molecular motion—typically, rotational isomeric [32] or “turnstile” type—that tends to be in synchronization with, and thus excited by, the passing tip at a particular scanning velocity [33].

This sample region was prepared for the purpose of measuring the water-swollen film thickness and analyzing the behavior of chain molecules in different conformational states. 16b and c, as (a) color-mapped height to examine Z values and (b) differential height (dZ/dX) to enhance texture. 8 Also called force–distance curves, force-displacement plots, force calibration plots, force spectroscopy, approach-retract curves, or force profiles. 5 mm in (b)–(d). (b) Contact-mode height image of film and exposed glass substrate collected in conventional (sliding) contact mode.

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Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications by Greg Haugstad

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